Rust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg Leaf Fract, TESCANScabiosa columbaria - Viktor Sykora, Charles University, Věda je krásná
Pollen of Lavatera arborea, TESCANScenedesmus quadricauda - Viktor Sykora, Charles University , Věda je krásnáPollen grain of Hyoseris radiata, TESCAN
Powder metallurgy substrate, TESCANChroococcus giganteus - Jan Stastny, Charles University, Věda je krásnáOrchid root showing with idioblastic cells, S. R. Senthilkumar, St. Joseph´s College, India
2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland Offretite Scagno, TESCAN
2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland 4- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland PbI2 Crystallization, TESCAN
Butterfly Wings, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland Coral, TESCANPhragmites communis - Jan Martinek, Charles University, Věda je krásná
Cross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina 1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland Orchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India

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Tuesday, 9 September
Time: 12:30 - 14:00

HITACHI (45 min)
Room: Club E (1st floor)

Title
Advanced in-situ studies and superfast 2sr EDX in Hitachi's latest TEM/STEM.

Speaker
Dr Mitsuru Konno

Abstract
The advanced gas handling, robust vacuum system and SE detection capability of Hitachi's 300kV Cold-FE TEM/STEM provide the perfect platform for high resolution gaseous in-situ studies of advanced nanomaterials. The technique has been applied to study the degradation mechanism of of Pt/C electro catalysts. Additionally, dual windowless SDD systems are applied to Hitachi's Cold-FE STEM system resulting in superfast EDX with 2 steradian solid angle. A variety of examples of high sensitivity elemental analysis will be presented.

 

 





 

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