Leaf Fract, TESCANCross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland
Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  Rotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland 2- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland
Rhaphoneis - Pavel Skaloud, Charles University, Věda je krásná3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Chroococcus giganteus - Jan Stastny, Charles University, Věda je krásná
Diatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria Orchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India Orchid root stained with Acridine orange, S. R. Senthilkumar, St. Joseph´s College, India
Salt, TESCANPollen grain of Hyoseris radiata, TESCAN1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland
Phragmites communis - Jan Martinek, Charles University, Věda je krásná1- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland 1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic Coral, TESCANRust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg

home   registration   submission   accomodation   social   exhibitors   tours

  


Tuesday, 9 September
Time: 12:30 - 14:00

HITACHI (45 min)
Room: Club E (1st floor)

Title
Advanced in-situ studies and superfast 2sr EDX in Hitachi's latest TEM/STEM.

Speaker
Dr Mitsuru Konno

Abstract
The advanced gas handling, robust vacuum system and SE detection capability of Hitachi's 300kV Cold-FE TEM/STEM provide the perfect platform for high resolution gaseous in-situ studies of advanced nanomaterials. The technique has been applied to study the degradation mechanism of of Pt/C electro catalysts. Additionally, dual windowless SDD systems are applied to Hitachi's Cold-FE STEM system resulting in superfast EDX with 2 steradian solid angle. A variety of examples of high sensitivity elemental analysis will be presented.

 

 





 

News

PLEASE GO TO THE
Gate

Individual

Proceedings

PRE AND POST congress activities

JOIN US FOR CONGRESS DINNER

CONGRESS POSTER


Vote for the best
micrograph in
"ART IN MICROSCOPY
"

Take a microscopy walk

DETAILED PROGRAM



IMC 2014 comming soon:

Deadlines

5 September 2014
- Vote for the Vox Populi Award

Media Partners







animation
   
 
Intranet