Eudorina - Pavel Skaloud, Charles University, Věda je krásná2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland
1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland Cross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina Uniform core shell Fe nanoparticles, S. Bandyopadhyay, NTNU, Trondheim
2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Orchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India Leaf Fract, TESCAN
Rust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg Gold on Germanium, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland Powder metallurgy substrate, TESCAN
Diatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria 4- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Orchid root stained with Acridine orange, S. R. Senthilkumar, St. Joseph´s College, India
Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  1- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Pollen grain of Hyoseris radiata, TESCAN
Salt, TESCANPlasma coating crossection, TESCAN1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland

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Wednesday, 10 September
Time: 12:30 - 14:00

HITACHI (45 min)
Room: Club E (1st floor)

Title
EM Wizard: A step change in practical usability for SEM

Speaker
Dr Mitsugu Sato

Abstract
Hitachi has developed a completely new operating methodology for SEM which enables any operator to achieve optimum results fully automatically. The new methodology is not only a new user interface but encompasses the fully automatic beam adjustment technologies Hitachi has been developing for many years in automated critical dimension SEM. Beam adjustment (axial alignment and stigma adjustment) are no longer necessary during operation because the SEM optics are perfectly adjusted automatically. The user can obtain high quality images simply by choosing the type of information they require from the sample. Automatic focusing can be undertaken rapidly and precisely even at high magnification. This unique capability is now an integral part of Hitachi's new Schottky FE-SEM, the SU5000.



 

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