Phragmites communis - Jan Martinek, Charles University, Věda je krásnáCross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina Rust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg
1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  Orchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India
Rotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland Pollen grain of Hyoseris radiata, TESCANPaulinella chromatophora - Yvonne Nemcova, Charles University, Věda je krásná
Pollen of Lavatera arborea, TESCANDiatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria Eudorina - Pavel Skaloud, Charles University, Věda je krásná
Offretite Scagno, TESCANPbI2 Crystallization, TESCAN1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
Powder metallurgy substrate, TESCANPolymer fibers, TESCANRhaphoneis - Pavel Skaloud, Charles University, Věda je krásná
Scabiosa columbaria - Viktor Sykora, Charles University, Věda je krásná3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic

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Wednesday, 10 September
Time: 12:30 - 14:00

HITACHI (45 min)
Room: Club E (1st floor)

Title
EM Wizard: A step change in practical usability for SEM

Speaker
Dr Mitsugu Sato

Abstract
Hitachi has developed a completely new operating methodology for SEM which enables any operator to achieve optimum results fully automatically. The new methodology is not only a new user interface but encompasses the fully automatic beam adjustment technologies Hitachi has been developing for many years in automated critical dimension SEM. Beam adjustment (axial alignment and stigma adjustment) are no longer necessary during operation because the SEM optics are perfectly adjusted automatically. The user can obtain high quality images simply by choosing the type of information they require from the sample. Automatic focusing can be undertaken rapidly and precisely even at high magnification. This unique capability is now an integral part of Hitachi's new Schottky FE-SEM, the SU5000.



 

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