Pollen grain of Hyoseris radiata, TESCANCoral, TESCAN3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland
3- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Offretite Scagno, TESCANCross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina
2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Polymer fibers, TESCANPollen of Lavatera arborea, TESCAN
Gold on Germanium, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland Diatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India
Rotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland Phragmites communis - Jan Martinek, Charles University, Věda je krásnáRhaphoneis - Pavel Skaloud, Charles University, Věda je krásná
Uniform core shell Fe nanoparticles, S. Bandyopadhyay, NTNU, Trondheim Scabiosa columbaria - Viktor Sykora, Charles University, Věda je krásnáSEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland
Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic Salt, TESCAN2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland

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Wednesday, 10 September
Time: 12:30 - 14:00

HITACHI (45 min)
Room: Club E (1st floor)

Title
EM Wizard: A step change in practical usability for SEM

Speaker
Dr Mitsugu Sato

Abstract
Hitachi has developed a completely new operating methodology for SEM which enables any operator to achieve optimum results fully automatically. The new methodology is not only a new user interface but encompasses the fully automatic beam adjustment technologies Hitachi has been developing for many years in automated critical dimension SEM. Beam adjustment (axial alignment and stigma adjustment) are no longer necessary during operation because the SEM optics are perfectly adjusted automatically. The user can obtain high quality images simply by choosing the type of information they require from the sample. Automatic focusing can be undertaken rapidly and precisely even at high magnification. This unique capability is now an integral part of Hitachi's new Schottky FE-SEM, the SU5000.



 

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