Plasma coating crossection, TESCANButterfly Wings, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland Collagen fibers in cartilage, E. I. Romijn, NTNU, Trondheim
Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  Scabiosa columbaria - Viktor Sykora, Charles University, Věda je krásnáCoral, TESCAN
Pollen grain of Hyoseris radiata, TESCANRotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland 1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
Chroococcus giganteus - Jan Stastny, Charles University, Věda je krásná2- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland 2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland
Salt, TESCAN1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland 4- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland
Diatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria Powder metallurgy substrate, TESCANOrchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India
Leaf Fract, TESCANRust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg Orchid root stained with Acridine orange, S. R. Senthilkumar, St. Joseph´s College, India

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Wednesday, 10 September
Time: 12:30 - 14:00

HITACHI (45 min)
Room: Club E (1st floor)

Title
EM Wizard: A step change in practical usability for SEM

Speaker
Dr Mitsugu Sato

Abstract
Hitachi has developed a completely new operating methodology for SEM which enables any operator to achieve optimum results fully automatically. The new methodology is not only a new user interface but encompasses the fully automatic beam adjustment technologies Hitachi has been developing for many years in automated critical dimension SEM. Beam adjustment (axial alignment and stigma adjustment) are no longer necessary during operation because the SEM optics are perfectly adjusted automatically. The user can obtain high quality images simply by choosing the type of information they require from the sample. Automatic focusing can be undertaken rapidly and precisely even at high magnification. This unique capability is now an integral part of Hitachi's new Schottky FE-SEM, the SU5000.



 

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