SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland Salt, TESCAN3- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Rhaphoneis - Pavel Skaloud, Charles University, Věda je krásná
2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Powder metallurgy substrate, TESCANDiatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria
Coral, TESCANLeaf Fract, TESCANCollagen fibers in cartilage, E. I. Romijn, NTNU, Trondheim
Orchid root stained with Acridine orange, S. R. Senthilkumar, St. Joseph´s College, India 1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland PbI2 Crystallization, TESCAN
Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic 1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland 2- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland
Plasma coating crossection, TESCANEudorina - Pavel Skaloud, Charles University, Věda je krásnáRotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland

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DSCN0721.JPGThe V. Ellis Cosslett Medal
Dr. Ondrej L. Krivanek
Nion Company and Arizona State University, USA

From the Prague Spring to a Spring in Electron Microscopy
Date: Friday, 12 September 2014, 12:00-12:50
Room: Congress Hall

Ondrej Ladislav Krivanek (born in Prague in 1950) received his primary and secondary education in Prague, and had a volunteer job as a tourist guide at the Prague Castle when 15. In 1968, the year of the "Prague Spring", he was accepted into Prague's Charles University to study physics, but he changed his plans when he saw images of Russian tanks rolling through the streets of Prague in the newspapers while visiting London that summer. He decided to stay in England, and he graduated with a B.Sc. from Leeds University and a Ph.D. in Physics from Cambridge University.

Ondrej was a postdoctoral fellow at Kyoto University, Bell Labs and the University of California at Berkeley, assistant professor of Physics at Arizona State University, director of research at Gatan, visiting professor at Tokyo Institute of Technology, CNRS Orsay and at Cambridge University, and research professor at University of Washington. In 1997, he co-founded Nion Company near Seattle in Washington State. He has since been Nion's president and more recently also adjunct professor of physics at Arizona State University.

During his post-doc at Berkeley, he found that he liked thinking up, designing, making and then using pioneering new instruments more than working with existing ones, and later on that instrument development can often be done more freely and effectively in a small company setting than in academia. Instruments whose design he originated, such as Gatan's electron energy loss spectrometers and imaging f ilters, CCD cameras and DigitalMicrograph software, and more recently electron-optical aberration correctors and Nion's whole electron microscopes and monochromators, can be found in many laboratories around the world, and they have helped to produce many scientif ic advances. The Nion microscopes in particular have been able to explore matter in unprecedented detail, launching a new spring in electron microscopy.

Ondrej has published over 240 papers and book chapters, with over 6000 citations. His work has been honored by an R&D 100 award (1993), the Seto Prize of the Japanese Electron Microcopy Society (1999), the Duddell Prize of the Institute of Physics (2000), the Distinguished Scientist Award of the Microscopy Society of America (2008), and an election to the British Royal Society (2010).

Selected papers:

“STEM imaging and spectroscopy with a 30 meV wide, atom-sized electron probe”, O.L. Krivanek, T.C. Lovejoy, N. Dellby and R.W. Carpenter, Microscopy 62 (2013) 3-21.

“Atom-by-atom structural and chemical analysis by annular dark field electron microscopy”, O.L. Krivanek, M.F. Chisholm, V. Nicolosi, T.J. Pennycook, G.J. Corbin, N. Dellby, M.F. Murfitt, C.S. Own, Z.S. Szilagyi, M.P. Oxley, S.T. Pantelides and S.J. Pennycook, Nature 464 (2010) 571-574.

“Aberration correction in electron microscopy” (book chapter)
O.L. Krivanek, N. Dellby and M.F. Murfitt, in: Handbook of Charged Particle Optics (2nd edition), (Orloff J., ed. Boca Raton: CRC Press, 2009) 601-640.

“Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy” D.A. Muller, L. Fitting-Kourkoutis, M.F. Murfitt, J.H. Song, H.Y. Wang, J. Silcox, N. Dellby and O.L. Krivanek, Science 319 (2008) 1073-1076.

“An electron microscope for the aberration-corrected era”, O.L. Krivanek, G.J. Corbin, N. Dellby, B.F. Elston, R.J. Keyse, M.F. Murfitt, C.S. Own, Z.S. Szilagyi and J.W. Woodruff, Ultramicroscopy 108 (2008) 179-195.

“Sub-Ångstrom resolution using aberration-corrected electron optics” P.E. Batson, N. Dellby and O.L. Krivanek, Nature 418 (2002) 617.

“Towards sub-Å electron beams”, O.L. Krivanek, N. Dellby and A.R. Lupini, Ultramicroscopy 78 (1999) 1-11.

“Parallel-detection electron spectrometer using quadrupole lenses” O.L. Krivanek, C.C. Ahn and R.B. Keeney, Ultramicroscopy 22 (1987) 103-116.

“EELS Atlas” (book), C.C. Ahn and O.L. Krivanek, Gatan Publishing, 1983. “Seeing "order" in amorphous materials”, O.L. Krivanek, P.H. Gaskell and A. Howie, Nature 262 (1976) 454-457.









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