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1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Phragmites communis - Jan Martinek, Charles University, Věda je krásnáLeaf Fract, TESCAN

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Electron optics and optical elements

Electron sources and electron-optical elements are decisive for microscope’s performance. These include all types of electron sources including pulsed and photoemission ones, high brightness guns, monochromators, aberration correctors, energy filters, detectors based on novel detection principles, beam splitters and deflectors, signal converters, and other electron-optical elements. The symposium aims to cover principles, design and experiments demonstrating the parameters achieved.

Session chairs:

Pieter Kruit
Delft University of Technology,
The Netherlands
Mohamed El-Gomati
The University of York,
United Kingdom

Invited speakers:

Johan Verbeeck
EMAT, University of Antwerp,
Belgium
Shin Fujita
Shimadzu Corporation,
Japan

 

SESSION PROGRAM:

SLOT A, 11 SEPTEMBER, SMALL HALL, 09:00 - 11:00

09:00 – 09:30
Verbeeck J. Advances in electron vortex experiments in the TEM (invited)
09:30 – 10:00 Fujita S. Electron Optics for High-brightness High-beam-current Column Design --- extracting micro-amperes from point cathodes --- (invited)
10:00 – 10:15 Sader K. Challenges in Phase Plate Development and Applications (oral)
10:15 – 10:30 Shiloh R. Sculpturing the electron wave function using nanoscale phase masks (oral)
10:30 – 10:45 Delby N. Tuning and Operation of a sub-20 meV Monochromator (oral)
10:45 – 11:00 Kasuya K
Magnetic-Field-Superimposed Cold Field Emission Gun for 1.2-MV Transmission Electron Microscope (oral)


 

 

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