Polymer fibers, TESCANPbI2 Crystallization, TESCANPhragmites communis - Jan Martinek, Charles University, Věda je krásná
Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  Cross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina Rust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg
Pollen of Lavatera arborea, TESCAN2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland 1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
1- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Butterfly Wings, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland Scenedesmus quadricauda - Viktor Sykora, Charles University , Věda je krásná
SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland Gold on Germanium, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic
Eudorina - Pavel Skaloud, Charles University, Věda je krásnáOrchid root stained with Acridine orange, S. R. Senthilkumar, St. Joseph´s College, India Diatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria
Leaf Fract, TESCANPlasma coating crossection, TESCAN4- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland

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Focused ion beam microscopy and techniques

This symposium covers ion sources (Ga, Xe etc), ion optics, secondary ion mass spectroscopy (SIMS), gas injection systems (GIS), 3D FIB tomography and chemical analysis, micromachining and specimen preparation, FIB analysis of biomaterials, ion/solid interactions, as well as novel applications including new instrumentation such as the He ion microscope, new sample preparation procedures, case studies and any other use of FIB in microscopy, problems with ion-beam induced emission of electrons and light, 3D characterization of materials via imaging, and x-ray microanalysis and electron backscatter diffraction.

Session chairs:

Joe Michael
Sandia National Laboratory,
USA
.
Lucille Giannuzzi
L.A. Giannuzzi
& Associates LLC,
USA

Invited speakers:

Marco Cantoni
EPFL,
Switzerland
.
Nicholas Antoniou
Harvard University,
USA

SESSION PROGRAM:

SLOT A, 10 SEPTEMBER, MEETING HALL 5, 09:00 - 11:00

09:00 – 09:30
Cantoni M. Advances in FIB Nanotomography (invited)
09:30 – 09:45 Kizilyaprak C. FIB-SEM Tomography of biological samples: Strategy of preparation to resolve high-resolution 3-D volumes (oral)
09:45 – 10:00 Joy D. C. Modeling of Ion Generated Secondary Electrons (oral)
10:00 – 10:30 Antoniou N. Development of cryogenic FIB-SEM based processes for organic and inorganic samples (invited)
10:30 – 10:45 Sedláček L. A focused Xe+-ion column for fast materials sputtering at high spatial resolution to carry out time-of-flight mass spectrometry with nanoscale precision within a scanning electron microscope (oral)
10:45 – 11:00 Schmied R.
Temperature Evolution during FIB Processing of Soft Matter: From Fundamentals towards TEM Lamella Preparation (oral)

 

 

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