Coral, TESCANPolymer fibers, TESCAN1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
Orchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland Cross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina
Uniform core shell Fe nanoparticles, S. Bandyopadhyay, NTNU, Trondheim Rotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India
Powder metallurgy substrate, TESCANPhragmites communis - Jan Martinek, Charles University, Věda je krásnáRust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg
1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland 2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland 2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland
Chroococcus giganteus - Jan Stastny, Charles University, Věda je krásná3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland 3- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
2- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland Offretite Scagno, TESCANCollagen fibers in cartilage, E. I. Romijn, NTNU, Trondheim

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Focused ion beam microscopy and techniques

This symposium covers ion sources (Ga, Xe etc), ion optics, secondary ion mass spectroscopy (SIMS), gas injection systems (GIS), 3D FIB tomography and chemical analysis, micromachining and specimen preparation, FIB analysis of biomaterials, ion/solid interactions, as well as novel applications including new instrumentation such as the He ion microscope, new sample preparation procedures, case studies and any other use of FIB in microscopy, problems with ion-beam induced emission of electrons and light, 3D characterization of materials via imaging, and x-ray microanalysis and electron backscatter diffraction.

Session chairs:

Joe Michael
Sandia National Laboratory,
USA
.
Lucille Giannuzzi
L.A. Giannuzzi
& Associates LLC,
USA

Invited speakers:

Marco Cantoni
EPFL,
Switzerland
.
Nicholas Antoniou
Harvard University,
USA

SESSION PROGRAM:

SLOT A, 10 SEPTEMBER, MEETING HALL 5, 09:00 - 11:00

09:00 – 09:30
Cantoni M. Advances in FIB Nanotomography (invited)
09:30 – 09:45 Kizilyaprak C. FIB-SEM Tomography of biological samples: Strategy of preparation to resolve high-resolution 3-D volumes (oral)
09:45 – 10:00 Joy D. C. Modeling of Ion Generated Secondary Electrons (oral)
10:00 – 10:30 Antoniou N. Development of cryogenic FIB-SEM based processes for organic and inorganic samples (invited)
10:30 – 10:45 Sedláček L. A focused Xe+-ion column for fast materials sputtering at high spatial resolution to carry out time-of-flight mass spectrometry with nanoscale precision within a scanning electron microscope (oral)
10:45 – 11:00 Schmied R.
Temperature Evolution during FIB Processing of Soft Matter: From Fundamentals towards TEM Lamella Preparation (oral)

 

 

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