Paulinella chromatophora - Yvonne Nemcova, Charles University, Věda je krásnáRhaphoneis - Pavel Skaloud, Charles University, Věda je krásnáEnergy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India
Powder metallurgy substrate, TESCANUniform core shell Fe nanoparticles, S. Bandyopadhyay, NTNU, Trondheim 4- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland
Offretite Scagno, TESCAN1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic
Leaf Fract, TESCANButterfly Wings, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland 3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland
Eudorina - Pavel Skaloud, Charles University, Věda je krásnáScabiosa columbaria - Viktor Sykora, Charles University, Věda je krásnáPollen of Lavatera arborea, TESCAN
1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland 3- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Coral, TESCAN
Orchid root showing with idioblastic cells, S. R. Senthilkumar, St. Joseph´s College, India Polymer fibers, TESCANPollen grain of Hyoseris radiata, TESCAN

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High-resolution TEM and STEM

This symposium covers aberration-corrected columns, novel precision stages, suppression of drifts and instabilities, shielding of columns, delocalization problems, atomic resolution of point defects, measurement of atomic positions, radiation damage demonstration and suppression, low dose imaging, combination of imaging modes, multichannel detection in STEM, etc. Novel approaches are welcome.

Session chairs:

Sandra van Aert
University of Antwerp,
Belgium
Joanne Etheridge
Monash University,
Australia

Invited speakers:

Peter Nellist
Department of Materials, University of Oxford,
United Kingdom
Naoya Shibata
Institute of Engineering Innovation, University of Tokyo,
Japan

Gianluigi Botton
McMaster University,
Canada

 

SESSION PROGRAM:

SLOT A, 9 SEPTEMBER, MEETING HALL 5, 14:00 - 16:00

14:00 – 14:30 Nellist P. D. Extending the capabilities of high-resolution STEM:measuring depth dependent strain using optical sectioning and aberration-free phase contrast imaging of low-Z materials (invited)
14:30 – 14:45
Rosenauer A. A Method to Analyse the Chemical Composition in (InGa)(NAs) based on Evaluation of HAADF Intensity in STEM (oral)
14:45 – 15:00 LeBeau J. M. Putting a New Spin on Scanning Transmission Electron Microscopy (oral)
15:00 – 15:15 Lotnyk A. Imaging of light elements by annular dark-field Cs-corrected STEM (oral)
15:15 – 15:30 Kahl F. Optimizing Phase Contrast Imaging in Aberration Corrected TEM (oral)
15:30 – 15:45 Martinez G. T. An alternative normalization method for quantitative STEM (oral)
15:45 – 16:00 Schowalter M.
Position resolved single electron response of the HAADF-STEM detector and improved method for intensity normalisation (oral)

SLOT B, 10 SEPTEMBER, MEETING HALL 5, 14:15 - 16:15

14:15 – 14:45 Shibata N. Advanced scanning transmission electron microscopy with segmented annular all field detector (invited)
14:45 – 15:00
Yankovich A. B. Measuring surface atom structures in Pt and Au nanocatalysts with high precision STEM imaging (oral)
15:00 – 15:15 MacArthur K. E. Channeling Effects on the Accuracy of HAADF STEM Quantification of Bimetallic Catalyst Nanoparticles (oral)
15:15 – 15:30 Thust A. Atomically Resolved 3D Shape Determination of an MgO Crystal from a Single HRTEM Image (oral)
15:30 – 15:45 Guerrero-Lebrero M. P. 3D strain in HAADF – STEM images (oral)
15:45 – 16:00 Ishikawa R. Three-dimensional location of a single dopant with atomic precision by aberration-corrected ADF STEM (oral)
16:00 – 16:15 Cooper D.
The detection of single dopant atoms by high-resolution off-axis electron holography (oral)

SLOT C, 11 SEPTEMBER, MEETING HALL 5, 14:00 - 16:00

14:00 – 14:30 Botton G. A. Insights into Materials Properties with Quantitative STEM and EELS (invited)
14:30 – 14:45
Zheng C. L. Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy (oral)
14:45 – 15:00 Ciston J. Atomic resolution secondary electron imaging and simulation of the SrTiO3 (001) c(6x2) surface reconstruction (oral)
15:00 – 15:15 Weyland M. Linking Thickness, Channelling and Secondary X-ray signals in Atomic Resolution Scanning Transmission Electron Microscopy (oral)
15:15 – 15:30 Houben L. Low-voltage and energy-filtered chromatic aberration-corrected high-resolution TEM on the PICO instrument (oral)
15:30 – 15:45 Liberti E. Towards a quantitative exit wave function: the influence of phonon scattering (oral)
15:45 – 16:00 Kimoto K.
Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus images (oral)

 

 

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