Phragmites communis - Jan Martinek, Charles University, Věda je krásnáSalt, TESCANPowder metallurgy substrate, TESCAN
1- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Cross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina Coral, TESCAN
Procapsid and nucleocapsid of dsRNA bacteriophage phi6, D. Nemecek, CryoEM Research Group CEITEC, Czech Republic Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  PbI2 Crystallization, TESCAN
Pollen of Lavatera arborea, TESCANEudorina - Pavel Skaloud, Charles University, Věda je krásnáUniform core shell Fe nanoparticles, S. Bandyopadhyay, NTNU, Trondheim
3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland SEM image of ink-bottle silica nanopores, A. Sterczynska,NanoBioMediacl Centre (CNBM), Poznan, Poland Leaf Fract, TESCAN
2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland 1- Diatom, Magdalena Parlinska, University of Rzeszow, Poland 1- CVD grown diamond film, Magdalena Parlinska, University of Rzeszow, Poland
2- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Offretite Scagno, TESCANDiatoms World, Mostafa Moonir Shawrav, Institute of Solid State Electronics, Austria

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High-resolution TEM and STEM

This symposium covers aberration-corrected columns, novel precision stages, suppression of drifts and instabilities, shielding of columns, delocalization problems, atomic resolution of point defects, measurement of atomic positions, radiation damage demonstration and suppression, low dose imaging, combination of imaging modes, multichannel detection in STEM, etc. Novel approaches are welcome.

Session chairs:

Sandra van Aert
University of Antwerp,
Joanne Etheridge
Monash University,

Invited speakers:

Peter Nellist
Department of Materials, University of Oxford,
United Kingdom
Naoya Shibata
Institute of Engineering Innovation, University of Tokyo,

Gianluigi Botton
McMaster University,



SLOT A, 9 SEPTEMBER, MEETING HALL 5, 14:00 - 16:00

14:00 – 14:30 Nellist P. D. Extending the capabilities of high-resolution STEM:measuring depth dependent strain using optical sectioning and aberration-free phase contrast imaging of low-Z materials (invited)
14:30 – 14:45
Rosenauer A. A Method to Analyse the Chemical Composition in (InGa)(NAs) based on Evaluation of HAADF Intensity in STEM (oral)
14:45 – 15:00 LeBeau J. M. Putting a New Spin on Scanning Transmission Electron Microscopy (oral)
15:00 – 15:15 Lotnyk A. Imaging of light elements by annular dark-field Cs-corrected STEM (oral)
15:15 – 15:30 Kahl F. Optimizing Phase Contrast Imaging in Aberration Corrected TEM (oral)
15:30 – 15:45 Martinez G. T. An alternative normalization method for quantitative STEM (oral)
15:45 – 16:00 Schowalter M.
Position resolved single electron response of the HAADF-STEM detector and improved method for intensity normalisation (oral)

SLOT B, 10 SEPTEMBER, MEETING HALL 5, 14:15 - 16:15

14:15 – 14:45 Shibata N. Advanced scanning transmission electron microscopy with segmented annular all field detector (invited)
14:45 – 15:00
Yankovich A. B. Measuring surface atom structures in Pt and Au nanocatalysts with high precision STEM imaging (oral)
15:00 – 15:15 MacArthur K. E. Channeling Effects on the Accuracy of HAADF STEM Quantification of Bimetallic Catalyst Nanoparticles (oral)
15:15 – 15:30 Thust A. Atomically Resolved 3D Shape Determination of an MgO Crystal from a Single HRTEM Image (oral)
15:30 – 15:45 Guerrero-Lebrero M. P. 3D strain in HAADF – STEM images (oral)
15:45 – 16:00 Ishikawa R. Three-dimensional location of a single dopant with atomic precision by aberration-corrected ADF STEM (oral)
16:00 – 16:15 Cooper D.
The detection of single dopant atoms by high-resolution off-axis electron holography (oral)

SLOT C, 11 SEPTEMBER, MEETING HALL 5, 14:00 - 16:00

14:00 – 14:30 Botton G. A. Insights into Materials Properties with Quantitative STEM and EELS (invited)
14:30 – 14:45
Zheng C. L. Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy (oral)
14:45 – 15:00 Ciston J. Atomic resolution secondary electron imaging and simulation of the SrTiO3 (001) c(6x2) surface reconstruction (oral)
15:00 – 15:15 Weyland M. Linking Thickness, Channelling and Secondary X-ray signals in Atomic Resolution Scanning Transmission Electron Microscopy (oral)
15:15 – 15:30 Houben L. Low-voltage and energy-filtered chromatic aberration-corrected high-resolution TEM on the PICO instrument (oral)
15:30 – 15:45 Liberti E. Towards a quantitative exit wave function: the influence of phonon scattering (oral)
15:45 – 16:00 Kimoto K.
Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus images (oral)







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