Energy filtered TEM micrograph of yttria (in green) - zirconia (in red) multilayers, Chanchal Ghosh,  IGCAR, Kalpakkam, India  3- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Uniform core shell Fe nanoparticles, S. Bandyopadhyay, NTNU, Trondheim
2- Diatom, Magdalena Parlinska, University of Rzeszow, Poland Plasma coating crossection, TESCANPaulinella chromatophora - Yvonne Nemcova, Charles University, Věda je krásná
Phragmites communis - Jan Martinek, Charles University, Věda je krásnáOrchid root showing with idioblastic cells, S. R. Senthilkumar, St. Joseph´s College, India Pollen grain of Hyoseris radiata, TESCAN
Scenedesmus quadricauda - Viktor Sykora, Charles University , Věda je krásnáChroococcus giganteus - Jan Stastny, Charles University, Věda je krásnáCross section of an Abutilon leaf, Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina
Orchid root with Mycorrhiza, S. R. Senthilkumar, St. Joseph´s College, India 1- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Gold on Germanium, Benedykt R. Jany, Marian SmoluchowskiInstitute of Physics - Jagiellonian University, Poland
Rotaviruses, Electronmicroscopy, Elisabeth M. Schraner, Institutes of Vet. Anatomy and Virology, Switzerland Leaf Fract, TESCAN3- Diatom, Magdalena Parlinska, University of Rzeszow, Poland
4- Gel beads coated with a RuC13 coatings, Magdalena Parlinska, University of Rzeszow, Poland Rust fungus spore,Adriana Dominguez and Eduardo Favret, CNEA - INTA, Argentina.jpg Eudorina - Pavel Skaloud, Charles University, Věda je krásná

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Scanning electron microscopy

This symposium addresses resolution improvement strategies, implementation of low and very low energy operation and multichannel detection, and methods of acquisition, processing and visualization of data cubes including FIB techniques. Auxiliary topics should cover energy/angular-sensitive electron detectors, transmission modes, surface treatment and in-situ processing for observation, columns compatible with extended fields of view and adjustable parameters of beam impact, as well as near-field emission scanning electron microscopy.

Session chairs:

Ilona Müllerová
Institute of Scientific Instruments,
Academy of Sciences,
Czech Republic
. .
Luděk Frank
ISI Brno,
Czech Republic
.

Invited speakers:

Brendan Griffin
Centre for Microscopy,
Australia
.
.
Luděk Frank
ISI Brno,
Czech Republic

.

 

SESSION PROGRAM:

SLOT A, 10 SEPTEMBER, MEETING HALL 4, 14:15 - 16:15

14:15 – 14:45 Griffin B. J. A review of SE and BSE imaging in SEM and Variable Pressure SEM (invited)
14:45 – 15:15
Frank L. Ultra-low-energy STEM in SEM (invited)
15:15 – 15:30 Masenelli-Varlot K. Low-voltage STEM tomography: an alternative for soft polymers and hydrated samples (oral)
15:30 – 15:45 Witherspoon K. C. Advancements in Integrated Micro-XRF in the SEM (oral)
15:45 – 16:00 Schauer P. Innovation possibilities of scintillation electron detector for SEM (oral)
16:00 – 16:15 Aoyama T. Quantitative interpretation for angle selective backscattering image of iron oxide on steel (oral)

 

 

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